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Textile Far - Infrared Radiation Heating Tester

Application ScopeThis instrument is used to determine the far-infrared properties of various textile

Email: info@standard-groups.com

Contenuto

Application Scope

This instrument is used to determine the far-infrared properties of various textile products, including fibers, yarns, fabrics, nonwoven fabrics, and their products, using the method of far-infrared emissivity measurement.

Principio di prova

The standard blackbody plate and the sample are placed on the hot plate in succession. The surface temperature of the hot plate is adjusted to the specified temperature in sequence. A far-infrared radiation measurement system with a spectral response range covering 5 microns to 14 microns is used to measure the radiation intensity of the standard blackbody plate and the sample after they are placed on the hot plate and reach a stable state. By calculating the ratio of the radiation intensity of the sample to that of the standard blackbody plate, the far-infrared emissivity of the sample can be obtained. For temperature rise measurement, the far-infrared radiation source irradiates the sample with a constant irradiance for a certain period of time, and then the temperature rise value on the test surface of the sample is measured.

Compliant Standards

GB/T 30127-41: Determination of Far-Infrared Emissivity

Instrument Features

1. Touch screen control and display with a menu-based operating mode, as convenient as using a smartphone.

2. The core control components use a self-developed multifunctional motherboard.

3. The instrument surface is coated with high-quality electrostatic powder coating, presenting a neat and attractive appearance.

4. Optical modulation technology is adopted, ensuring that measurements are not affected by the surface radiation of the tested object or environmental radiation.

5. To ensure the measurement accuracy of the instrument, the system is equipped with a self-repair function and customizable window settings to account for measurement errors caused by sample diffuse reflection.

6. Lock-in technology and microelectronic technology are used in signal and electronics processing, enabling the detection of weak signals and further improving instrument performance.

7. The measurement process does not damage the tested sample, and the operation is simple and highly flexible.

8. Equipped with USB interface, networking interface, and Windows-compatible software.

9. Comes with a self-developed temperature measurement and control system.

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